National Nanotechnology Infrastructure Network

National Nanotechnology Infrastructure Network

Serving Nanoscale Science, Engineering & Technology

Jason Tresback

617-496-1783

Harvard University

Senior Metrology Engineer

J. Tresback conducts training and support of fundamental metrology tools and techniques at CNS including, optical microscopy, profilometry, ellipsometry, and Atomic Force Microscopy (AFM).  He is also devoted to electrical properties measurements at CNS including, Van der Pauw resistivity and hall measurements, thin film electrical characterization, and general device probing and testing.