National Nanotechnology Infrastructure Network

National Nanotechnology Infrastructure Network

Serving Nanoscale Science, Engineering & Technology

Walter Henderson


Georgia Institute of Technology


Research Scientist

Walter has extensive experience in surface-science characterization techniques including XPS, Auger, SIMS/ToF-SIMS, etc.  My academic preparation was in physics with a concentration in optics.  Most of his academic work has been with III-Nitride and transition metal oxide semiconductor growth and characterization, which has given me a broad base in materials science, surface physics, physical chemistry, and various characterization methods.